ESSIM Summer School‎ > ‎Courses‎ > ‎

Multivariate statistics for Microelectronics

posted Mar 19, 2011, 2:07 PM by Giacomo Aletti   [ updated Apr 12, 2011, 4:46 AM ]
Teachers: A.Micheletti, Universita' degli Studi di Milano

Abstract

In this course we will introduce some methods of multivariate and functional statistics useful to perform data analyses, and in particular regressions, when the data are interpreted as realizations of random functions. Such problems arise frequently when the variables measured in an experiment are either random vectors, or functions or fields, and we are interested in finding an analitical expression for the mean function or operator which links two groups of such variables, called the regressors and the response. This is the case e.g. when dealing with some physical quantities measured on electronic devices in microelectronics, like the electrical field, its intensity, the mobility of the electrons, etc. When the dimension of the device is very small (nanoscale), the random location of the single atoms of dopants is relevant to determine the spatial structure of such fields and the identification of an analitic relationship between the location of the atoms and the functions describing such fields would be quite useful to accelerate the procedure of simulation and optimization of electronic devices. 
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